Afacan, E., Dündar, G., Başkaya, F., 'Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena', Microelectronics Reliability, 54, 2, 397-403, 2014.

Yayın Tarihi: 
Çarşamba, 1 Ocak, 2014
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